ISO 9001:2008
Modern means of measuring equipment
 

HOMMEL NANOSCAN 855

Production:
JENOPTIK Industrial Metrology Germany (Germany)

Equipment for measuring roughness, ripple, micro- and macro profiles (WAVELINE) HOMMEL NANOSCAN 855

TWO IN ONE

HOMMEL nanoscan 855 combined device for simultaneous control of roughness and surface contour in one pass.

ULTRA-PRECISE OPTICAL-MECHANICAL MEASURING SYSTEM

For a synchronous measurement of roughness characteristics and surface contours on curvilinear and inclined surfaces, a high-precision measuring system with a wide measuring range is necessary. HOMMEL nanoscan 855 is a SUPER-accurate measuring system with a resolution of 0.6 nanometers on a range of 24 mm. Simultaneously with high accuracy of the movement, this device has excellent accuracy characteristics of the parameters of the micro geometry and the contour in a wide range.

AUTOMATED MEASUREMENT CYCLE

The nanoscan 855 roughness testing station, together with high accuracy, provides a high speed measurement completely in the CNC mode, which guarantees high productivity in quality control.

Functional characteristics

  • Ergonomic design
  • Active vibration reduction system
  • Station management with a joystick
  • Measure the roughness and contour in one pass
  • There is no need to level the surface before measurement, which saves time
  • Ability to measure roughness on spheres
  • Ultra-low internal noises
  • Suitable for measuring high-purity surfaces
  • Measurement of parameters of profile elements with high accuracy: circle (radius, diameters, center-to-center distances), sections of the contour (distances, angles, steps, straightness, auto-alignment), etc.

Specifications

Parameter measur. units value
In horizontal plane

Trace length mm 0,1 ... 200
Trace speed mm/s 0,05 ... 10
Measuring speed mm/s 0,05 ... 5
Data sampling interval mkm 0,01 ... 10
Straightness of running mkm/mm 0,4 / 200
In vertical plane

Measuring range mm 24
Resolution nm 0,6
Measuring force mN ±0,5 ... 50

Additional information