HOMMEL-ETAMIC Waveline W600
Manufacturer:
- JENOPTIK Industrial Metrology Germany (Germany)
Waveline W612 with Digiscan measuring system for contour measurement and accessories
Simple operation and flexible use
Waveline W600 roughness and contour measurement systems are easy to operate and, with manual height adjustment, a wide range of mounting options and high measurement quality, are the ideal companion for measurements close to production.
System features
- Universal, easy-to-use measuring system
- High measurement quality thanks to stable mechanics
- Unique traverse concept for optimum accessibility of the measuring points
- Modern touch probes with high resolution
- Interface for probe systems for either roughness or contour measurement with TKU400 or Digiscan probe system
- Quick-change adapter QCA enables quick probe system changeover with minimum retooling time due to automatic probe recognition
- Sophisticated probe arm technology
- Probe arms with magnetic coupling for fast and easy probe arm changeover
- All contour probe arms with RFID chip for simplified calibration and automatic configuration
- Measuring points freely accessible thanks to unique traverse unit concept
- Later expansion of the measuring system possible
W600 Mesuring probe
TKU400 with TAM probe arms: roughness measurement
- Universal roughness probe system
- Large measuring range (up to ± 800 µm)
- Suitable for length and transverse measurements
- Easily exchangeable probe arms
Digiscan with TD probe arms: contour measurement
- Digital measuring system with high resolution
- Optional top/bottom measurement
- Probe arms with magnetic coupling and electronic detection
- Extensive range of probe arm solutions
Probe arm |
Measuring range | Resolution |
|
Probe system |
TKU400 |
Digiscan |
| Standard length | ±400 µm | 1 nm | 60 mm | 10 nm |
| 2-fold length | ±800 µm | 2 nm | 90 mm | 15 nm |
For more information about the system specifications, see the link Waveline W600/W800/W900 specifications.
EVOVIS
Evaluation software for roughness and contour measurement
Specifications
Measuring system |
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Model |
W612 |
|
Traverse unit Xmove 120-8 |
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| Traverse length | 120 mm | |
| Straightness | 0.9 µm | |
| Positioning repeatability | < <50 µm | |
| X axis scale resolution | 0.1 µm | |
| Max. positioning speed | 20 mm/s | |
| Max. basic disturbance Rz (0.2 mm/s) | < 60 nm | |
Measuring column Zpos 300M |
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| Vertical travel | 300 mm | |
Probe systems |
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Probe systems |
TKU400 |
Digiscan |
| Measurement of | roughness | contour |
| Measuring range/resolution (Standard probe arm length) | ± 400 µm / 1 nm 1) | ± 60 mm / 10 nm 1) |
| Measuring range/resolution (1.5x probe arm length) | ± 600 µm / 1.5 nm 1) | ± 90 mm / 15 nm 1) |
| Measuring range/resolution (2x probe arm length) | ± 800 µm /2 nm 1) | - |
Accuracy |
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| Rz min. tolerance cg/cgk ≥ 1,33 | 1.2 µm | - |
| Radius measurement R = 15 mm | - | ± 7 µm |
| Radius form deviation | - | 5 µm |
General features |
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| Top/bottom measurement | no | optional |
| Measuring principle | analog | digital |
| Probe identifiation | yes | yes |
| Probe force setting | fied | electronic |
| Probe arm identifiation | no | yes |
| Probe arm interface | magnetic | magnetic |
System confiurations |
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System confiuration |
Description |
|
| W612R | roughness measuring station with probe system TKU400 | |
| W612C Digiscan | contour measuring station with probe system Digiscan | |
| W612RC Digiscan | roughness and contour measuring station with separate probe systems TKU400 and Digiscan | |
