HOMMEL-ETAMIC Waveline W600

Production:

JENOPTIK Industrial Metrology Germany (Germany)

Waveline W612 with Digiscan measuring system for contour measurement and accessories

Simple operation and flexible use

Waveline W600 roughness and contour measurement systems are easy to operate and, with manual height adjustment, a wide range of mounting options and high measurement quality, are the ideal companion for measurements close to production.

System features

• Universal, easy-to-use measuring system
  
• High measurement quality thanks to stable mechanics
  
• Unique traverse concept for optimum accessibility of the measuring points
  
• Modern touch probes with high resolution
  
• Interface for probe systems for either roughness or contour measurement with TKU400 or Digiscan probe system
  
• Quick-change adapter QCA enables quick probe system changeover with minimum retooling time due to automatic probe recognition
  
• Sophisticated probe arm technology
  
• Probe arms with magnetic coupling for fast and easy probe arm changeover
  
• All contour probe arms with RFID chip for simplified calibration and automatic configuration
  
• Measuring points freely accessible thanks to unique traverse unit concept
  
• Later expansion of the measuring system possible

W600 Mesuring probe

TKU400 with TAM probe arms: roughness measurement

• Universal roughness probe system
  
• Large measuring range (up to ± 800 µm)
  
• Suitable for length and transverse measurements
  
• Easily exchangeable probe arms
  
  
  
  
  

Digiscan with TD probe arms: contour measurement

• Digital measuring system with high resolution
  
• Optional top/bottom measurement
  
• Probe arms with magnetic coupling and electronic detection
  
• Extensive range of probe arm solutions
  
  
  
  

Probe arm	Measuring range | Resolution
Probe system	TKU400	Digiscan
Standard length	±400 µm | 1 nm	60 mm | 10 nm
2-fold length	±800 µm | 2 nm	90 mm | 15 nm

For more information about the system specifications, see the link Waveline W600/W800/W900 specifications.

EVOVIS

Evaluation software for roughness and contour measurement

EVOVIS

Specifications

Measuring system
Model	W612
Traverse unit Xmove 120-8
Traverse length	120 mm
Straightness	0.9 µm
Positioning repeatability	< <50 µm
X axis scale resolution	0.1 µm
Max. positioning speed	20 mm/s
Max. basic disturbance Rz (0.2 mm/s)	< 60 nm
Measuring column Zpos 300M
Vertical travel	300 mm
Probe systems
Probe systems	TKU400	Digiscan
Measurement of	roughness	contour
Measuring range/resolution (Standard probe arm length)	± 400 µm / 1 nm 1)	± 60 mm / 10 nm 1)
Measuring range/resolution (1.5x probe arm length)	± 600 µm / 1.5 nm 1)	± 90 mm / 15 nm 1)
Measuring range/resolution (2x probe arm length)	± 800 µm /2 nm 1)	-
Accuracy
Rz min. tolerance cg/cgk ≥ 1,33	1.2 µm	-
Radius measurement R = 15 mm	-	± 7 µm
Radius form deviation	-	5 µm
General features
Top/bottom measurement	no	optional
Measuring principle	analog	digital
Probe identifiation	yes	yes
Probe force setting	fied	electronic
Probe arm identifiation	no	yes
Probe arm interface	magnetic	magnetic
System confiurations
System confiuration	Description
W612R	roughness measuring station with probe system TKU400
W612C Digiscan	contour measuring station with probe system Digiscan
W612RC Digiscan	roughness and contour measuring station with separate probe systems TKU400 and Digiscan

¹⁾ Resolution across the entire measuring range.